Status:
application definition, extends NXxbase, version 1.0b
Description:
This is the application definition for raw data from a single crystal diffractometer measuring in normal beam mode. It extends NXxbase, so the full definition is the content of NXxbase plus the data defined here. All angles are logged in order to support arbitrary scans in reciprocal space.
Symbols:
No symbol table
Structure:
entry: NXentry
definition: NX_CHAR
Official NeXus NXDL schema to which this file conforms
Obligatory value: NXxnb
instrument: NXinstrument
detector: NXdetector
sample: NXsample
name: NXdata
polar_angle –> /NXentry/NXinstrument/NXdetector/polar_angle
tilt –> /NXentry/NXinstrument/NXdetector/tilt
rotation_angle –> /NXentry/NXsample/rotation_angle