Status:
application definition, extends NXxbase, version 1.0b
Description:
This is the application definition for raw data from a kappa geometry (CAD4) single crystal diffractometer. It extends NXxbase, so the full definition is the content of NXxbase plus the data defined here.
Symbols:
No symbol table
Structure:
entry: NXentry
definition: NX_CHAR
Official NeXus NXDL schema to which this file conforms
Obligatory value: NXxkappa
instrument: NXinstrument
detector: NXdetector
sample: NXsample
rotation_angle[np]: NX_FLOAT {units=NX_ANGLE}
This is an array holding the sample rotation angle at each scan pointkappa[np]: NX_FLOAT {units=NX_ANGLE}
This is an array holding the kappa angle at each scan pointphi[np]: NX_FLOAT {units=NX_ANGLE}
This is an array holding the phi angle at each scan pointalpha: NX_FLOAT {units=NX_ANGLE}
This holds the inclination angle of the kappa arm.name: NXdata
polar_angle –> /NXentry/NXinstrument/NXdetector/polar_angle
rotation_angle –> /NXentry/NXsample/rotation_angle
kappa –> /NXentry/NXsample/kappa
phi –> /NXentry/NXsample/phi